Parallelization tester is used to test the parallel degree of multi-optic-axes system of the large scale photoelectric theodolite with precision less than 0.5 arcsec 摘要平行度测试仪是检测大型光电经纬仪多光轴系统平行度的设备,要求平行度测试仪的精度要达到0.5"。
After experimentally measuring and marking, this instrument's precision reaches 0.5 arcsec, which better satisfies the requirement-normally 2 arcsec the parallel precision of optical system testing 经检测标定后平行度测试仪的精度可达到0.5",能够很好的满足检测平行度为创的光学系统的检测。
After experimentally measuring and marking, this instrument's precision reaches 0.5 arcsec, which better satisfies the requirement-normally 2 arcsec the parallel precision of optical system testing 经检测标定后平行度测试仪的精度可达到0.5",能够很好的满足检测平行度为创的光学系统的检测。
In addtion, the growth rate of low temperature insb buffer layer was 0.26 m / h, which was obtained by rheed intensity oscillation curves . growth temperature of insb epilayers were investigated with sem and dcxrd, and it was found that the optimum temperature was 440 . a 2.1 m insb layer grown at 440 had an x-ray rocking curve of 412 arcsec, the strain relaxtion was about 99.02 % 通过扫描电镜形貌观察与能谱分析发现:温度较低时sb的表面迁移率低,容易在表面堆积;结合x射线双晶衍射分析,确定高温insb外延生长的最佳衬底温度为440,该温度下生长2.1m的样品x射线半高峰宽为412,应变弛豫99.02%。