Crater - visible under diffused illumination , a surface imperfection on a wafer that can be distinguished individually 微坑-在可下明照散扩见的,晶圆片表面可区分的缺陷。
Standard test method for measurement of the luminance coefficient under diffuse illumination of pavement marking materials using a portable reflectometer 用便携式反射计测量路面标记材料在漫射照明时发光系数的标准试验方法