electron diffraction pattern中文是什么意思

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中文翻译
造句

电子衍射花样
电子衍射图象
电子衍射图样

electron n. 【物理学】电子。 the electron bea ...
pattern n. 1.模范，榜样；典范。 2.型，模型；模式；雏型； ...
diffraction of electron 电子的绕射
electron diffraction 电子衍射，电子绕射
electron-diffraction 电子衍射
diffraction pattern 绕射图式; 绕射图像; 绕射型; 衍射图形；衍射花样; 衍射图样
camera for electron diffraction 电子衍射照相机
convergent beam electron diffraction 会聚束电子衍射
electron diffraction analysis 电子绕射分析; 电子衍射分析
electron diffraction apparatus 电子衍射装置
electron diffraction camera 电子衍射摄象机; 电子衍射摄影机; 电子衍射照相机; 电子衍射照像机; 电子衍射照象机
electron diffraction contrast effect 电子衍射衬比效应
electron diffraction crystallography 电子衍射晶体学
electron diffraction diagram 电子衍射图
electron diffraction i trument 电子衍射仪
electron diffraction image 电子通道花样; 电子衍射象
electron diffraction instrument 电子衍射仪
electron diffraction investigation 电子衍射调查; 电子衍射研究
electron diffraction photograph 电子衍射照相
electron diffraction study 电子衍射研究
electron diffraction technique 电子衍射法
electron micro-diffraction 电子显微衍射
electron-diffraction method(eed) 电子衍射法
gas electron diffraction 气体电子衍射法
high energy electron diffraction 高能电子衍射

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例句与用法

Tem and electron diffraction patterns show that there exist two major forms of nanowires possessing different morphologies and growth directions , which may indicate that different mechanisms predominate in the growth process
产物中主要包括两种类型的si纳米线，二者具有不同的形貌和结构特征，因此它们遵从不同的生长机制。
The orientation relationships between cu and mgo are determined by means of electron diffraction patterns . the interface structures are analyzed according to high - resolution images of tem , csl and 0 - lattice theories and verified by simulation computation method
通过电子衍射图确定了cu与mgo之间的各种取向关系；根据高分辨像对界面结构进行了研究；通过计算模拟验证了重位点阵和o -点阵理论。
For xrd , ellipsometry examinations , single - side - polished si ( lll ) wafers were used as substrates and for resistance measurement , glass was used and for infrared examination , double - side - polished si ( lll ) wafers were used and for ultraviolet - visible spectrophotometry , double - side - polished quartz wafers were used and for tem micrograph and electron diffraction pattern observation , cu nets deposited by formvar film were used . the cu - mgf2 cermet films were from 50 to 600nm thick
用于xrd分析、椭偏测量的单抛si ( 111 )晶片和电阻测试的载玻片上淀积膜厚约为600nm ；用于ir测试的双抛si ( 111 )晶片和uv测试的石英玻璃片上淀积膜厚约为250nm ；用于透射电镜分析的样品则淀积在400目铜网上的支撑formvar膜上，膜厚约为50 100nm 。

其他语种释义

electron diffraction patternとは意味：電子回折像｛でんしかいせつぞう｝

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Last modified time:Mon, 11 Aug 2025 00:29:56 GMT