scanning electron microscope(sem)中文是什么意思

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中文翻译
造句

扫描电子显微镜

scanning n. 1.细看，细察，审视。 2.【电视】扫描，扫掠,搜 ...
electron microscope 电子显微镜。
sem SEM ＝scanning electron micro ...
scanning electron microscope (sem) 扫描电子显微镜
sem scanning electron microscope 扫描电子显微镜的缩略语
auger scanning electron microscope 离子枪式扫描电子显微镜
biological scanning electron microscope 生物扫描电子显微镜
dynamic scanning electron microscope 动态扫描电子显微术
electron scanning microscope 电子扫描显微镜
popular scanning electron microscope 普及型扫描电子显微镜
scanning auger electron microscope 扫描型奥格电子显微镜
scanning electron microscope 电子扫描显微镜; 扫描电镜; 扫描电子显微镜; 扫描式电子显微镜; 扫描型电子显微镜; 扫瞄电子显微镜
television scanning electron microscope 电视扫描电子显微镜
use of scanning electron microscope 扫描电子显微镜的使用
scanning microscope 扫描电子显微镜; 扫描显微镜
（sem） sca ing electronic microscope 扫描电镜
microscope electron 电子显微镜
electron scanning 电子扫描
auger scanning microscope 俄歇扫描电子显微镜
fast-scanning infrared microscope 快速扫描红外显微镜
laser scanning confocal microscope 激光扫描共焦显微镜
laser scanning confoeal microscope 激光扫描共焦显微镜
laser scanning microscope 激光扫描显微镜
multipurpose scanning microscope 多用途扫描显微镜
scanning acoustic microscope 扫描声波显微镜; 扫描声学显微镜

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例句与用法

Energy spectrometer and atomic absorption spectrum ( aas ) were used to determine their compositions , and scanning electron microscope ( sem ) , transmission electron microscopic ( tem ) were used to analysis the appearance of the samples
用原子吸收分光度法和能谱确定样品的组成。扫描电子显示镜( sem )和透射电子显微镜( tem )分析了样品的表面形貌及粒径特征。
Ae signals released from different lay - ups composite specimens were acquired by a wideband transducer , and fracture surfaces of the specimens were observed by scanning electron microscope ( sem )
宽带传感器记录了不同角度纤维铺层的复合材料试样在拉伸破坏过程中的声发射信号，用扫描电子显微镜( sem )观察了试样的几种典型的损伤破坏断面，对比分析了不同类型的损伤机制。
The results of x - ray photoelectron spectrum ( xps ) demonstrated the ce ions in pure phase ce : yig ( x < 0 . 2 ) were in the state of trivalence . scanning electron microscope ( sem ) analysis showed conglobation of yig and ce : yig particles , whose size were smaller than 1 urn
Xps的分析结果显示单相ce ： yig ( x 0 . 2时)中ce离子是以正三价的状态存在，这与物相分析结果是一致的。
Various types of techniques have been applied to study the main principle problem . these techniques involve petrography , x - ray diffraction ( xrd ) , scanning electron microscope ( sem ) , carbon isotope , cathodoluminescence ( cl ) , fluid inclusion , and epoxy - resin casts
论文中所用的分析原理与技术方法包括：层序地层学分析、 x -衍射、扫描电镜、稳定同位素、阴极发光、流体包裹体与染色铸体薄片等。
The influence factors on the pl intensities of the ps suspension , such as deposition time and applied electric field intensity , were examined in detail . the morphology of the deposited ps films and as - prepared ps has been measured using scanning electron microscope ( sem )
然后以zn zno仔s电极作正极，锌片作负极，置于纳米zno的悬浮体系中，在电场强度为300v cm时电泳20min ，这样形成了zno ps zno夹心结构。
Polaride microscope and scanning electron microscope ( sem ) were used to study the molecule texture and the polymer network structure . the paper had compared the difference between the polymer of the traditional polymer network liquid and the egdmma polymer and analyzed the polymerization mechanism
采用正交偏光显微镜和电子扫描电镜研究了聚合物网络形貌和结构，比较了传统的聚合物网络稳定液晶中聚合物的差异，并分析了聚合机理。
The effect of growth parameters on the morphology , structure and chemical compositon of sic whiskers have been characterized by x - ray diffraction ( xrd ) , scanning electron microscope ( sem ) , energy dispersive x - ray spectroscopy ( eds ) and transmission electron microscope ( tem )
运用x射线衍射( xrd ) 、扫描电子显微镜( sem ) 、电子能量色散谱( eds ) 、透射电子显微镜( tem )等表征手段,系统研究了工艺参数对sic晶须形貌、结构和化学成份的影响。
Using scan electron microscope ( sem ) and electron probe analysis ( epa ) to analyze the post - polishing surface dealt with traditional cleaning method , we discover that the main residual contaminate is micron and submicron polishing particles adhered to the super - smooth surface
利用扫描电镜和电子探针分析了光学基片上吸附污染微粒的性质和分布，发现用传统的清洗方法清洗后表面仍然吸附着大量微米级和亚微米级的抛光微粒，它们与基体间紧密吸附。
To measure the size of ba - ferrite fine magnetic particles , electromagnetic field was employed to drive the fine magnetic particles displace in order , then scanning electron microscope ( sem ) was used to observe and measure the size of ba - ferrite fine magnetic particles
为了迅速、准确地测定钡铁氧体磁粉颗粒的厚度、直径和厚径比的统计分布，采用对磁颗粒施加外加电磁场的方法，使各个磁颗粒的易磁化轴方向趋于一致，并用扫描电子显微镜观察钡铁氧体磁粉颗粒。
Our experiments emphasized the correlation between micro structures and some properties of the coatings and tried to obtain the protective coatings with the comprehensively good properties , in which auger electron spectroscopy ( aes ) , scanning electron microscope ( sem ) , and x - ray diffraction ( xrd ) were employed to investigate the composition , microstructure and crystal phase of the coatings respectively , and the properties test was primarily considered with the wear resistance and corrosion resistance of the coatings
本论文主要采用pvd技术中的磁控溅射镀膜( ms或rms )及部分用等离子喷涂( ps )和热氧化( to )表面处理技术研究了铀的具有代表性的三种防腐保护镀层，即单质al 、氧化物al _ 2o _ 3和合金al - zn镀层。实验力图在制备技术、工艺参数及镀层的微结构和性能之间找到一些内在的联系，探索综合性能较好的防腐蚀镀层。

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Last modified time:Fri, 15 Aug 2025 00:29:56 GMT