Standard test method for determining the linearity of a photovoltaic device parameter with respect to a test parameter 根据试验参数测定光电器件参数线性度的标准试验方法
The research of the effect of soi s - resurf included the impact of the geometry parameters and drift doping concentration on breakdown voltage and on - resistance Soisingle - resurf效应研究。研究了soisingle - resurfldmos的器件参数对击穿电压和导通电阻的影响。
Using this model the basic demultiplexing characteristics of edo are obtained . the results include the intensity distribution along output , spectral response , dispersion , etc 利用这个模型对设计好的器件参数进行了模场形状、频谱相应、色散等复用性能的模拟。
From the result of the practice , this structure enhances the brightness of led effectively , improves the quality of the crystal and improves the performance of the device 并且从实验结果看,双层突变异质结有效提高发光亮度,改善了器件参数,晶体质量变好。
Chapter 3 gives the topology of the main circuit on the base of meeting the request of this project , and also the parameters for the most important components in the circuit 第三章在对课题要求的基础上选择了主电路拓扑,并对主要的器件参数进行了计算与设置。
器件: device; parts of an apparatu ...参数: parameter器件参数域: device parameter area液晶显示器件参数符号: letter symbols of parameter for liquid crystal display devices文件参数块: file parameter block测试文件参数: test file para meters; testfileparameters实在文件参数: actual file parameter参数器件: parametric device电子元件参数测试仪器: electronic component parameter measuring i trument; electronic component parameter measuring instrument器件: device; parts of an apparatus or appliance; component 电子器件 electronic device文件参考: file references文件参考线: document reference edge工作条件参比: reference operating condition文件参考边缘: document reference edge硬件参考设计: hrd hardware reference design参数: parameter 动态参数 dynamic parameter 公共硬件参考平台: chr common hardware reference platform共用硬件参考平台: common hardware reference platform主要部件参考表: master parts reference list“与”器件: and device半器件: semiconductor devices器件;装置: device器件包: components package器件库: part library新器件: new device